Committee Chair

Loveless, T. Daniel

Committee Member

Ofoli, Abdul R.; Reising, Donald R.


Dept. of Electrical Engineering


College of Engineering and Computer Science


University of Tennessee at Chattanooga

Place of Publication

Chattanooga (Tenn.)


The reliability of microelectronics operating in harsh environments is a concern for space systems. Various stresses, such as exposure to ionizing radiation and extreme temperatures can result in performance degradation, transient anomalies, and hard failures. These issues have become evident in recent years with the increasing interest in the use of commercial-off-the-shelf (COTS) electronics in space systems. While COTS parts offer maximum performance, their use results in unavoidable increases in risk. This work presents a noninvasive technique for the measurement of cumulative and transient radiation effects in arbitrary circuits, termed ionizing radiation effects spectroscopy (IRES). IRES identifies radiation effects based on statistical time-frequency analyses of native waveform behavior, thus having a minimal impact on operating performance. The resulting measures are used to identify parametric shifts as well as transient anomalies. IRES, which exploits the subtle characteristics inherent in the waveforms, shows promise for in-situ health monitoring and radiation mitigation.


I would like to thank the Defense Thread Reduction Agency, the Tennessee Higher Education Commission through the Center of Excellence in Applied Computational Science and Engineering Program at The University of Tennessee at Chattanooga (UTC), and the National Science Foundation (NSF) for supporting my work. I would like to thank Dr. Daniel Loveless for mentoring and supporting me through my undergraduate and graduate school experience. I cannot thank him enough for helping me develop the technical skills that would be invaluable when I go to industry. I would also like to thank Dr. Donald Reising for advising me on engineering problems during my graduate school experience at UTC. I would like to thank my committee: Dr. Daniel Loveless, Dr. Donald Reising and Dr. Abdul Ofoli for reviewing the thesis and giving me suggestions for improvement such that this work can be presented most accurately. I would also like to thank my colleagues at UTC for their support in the research.


M. S.; A thesis submitted to the faculty of the University of Tennessee at Chattanooga in partial fulfillment of the requirements of the degree of Master of Science.




Materials -- Effect of radiation on; Atmospheric radiation; Radiation -- Measurement

Document Type

Masters theses




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