Project Director
Reising, Donald
Department Examiner
Loveless, Thomas Daniel; Ahmed, Raga
Publisher
University of Tennessee at Chattanooga
Place of Publication
Chattanooga (Tenn.)
Abstract
As the electronics industry transitions to using commercial-off-the-shelf (COTS) devices of increasingly smaller technologies, radiation effects analysis becomes more significant in mission planning. In this work a probabilistic risk assessment (PRA) program, RadSTATS, is used in the analysis of various COTS memories in a radiation environment. The probabilities that the bits in memory will be flipped due to single event upset (SEU) rates are calculated for each memory, volatile and non-volatile. The unavailability of bits was discovered to increase with increasing storage capacity. Methods of error detection and correction (EDAC) between the same manufacturer were seen to decrease at unavailability percent rates by a similar order of magnitude. Using the observed trends between memories, a Cypress flash with test data was used to help predict the unavailability of another Cypress flash without prior performed testing.
Acknowledgments
Many thanks to the following people for all their help and advice on the project: Stephen Lawrence, Dr. Donald Reising, Dr. Daniel Loveless, Dr. Ignacio Mateos, Chris Harmon, Pablo Cárdenas, Cristian María, and Jake Carpenter Many thanks to the following universities and institutions for their contributions to the project: The University of Tennessee at Chattanooga, La Universidad de Cadiz, National Aeronautical Space Administration (NASA), European Space Agency (ESA), and Applied Physics Laboratory (APL) Additionally many thanks to all family and friends who helped in the production process of this work through encouragement and support.
Degree
B. S.; An honors thesis submitted to the faculty of the University of Tennessee at Chattanooga in partial fulfillment of the requirements of the degree of Bachelor of Science.
Date
5-2024
Subject
Electronic apparatus and appliances--Effect of radiation on; Electronic apparatus and appliances--Reliability; Radiation hardening; Semiconductors--Testing
Discipline
Electronic Devices and Semiconductor Manufacturing
Document Type
Theses
Extent
x, 54 leaves
DCMI Type
Text
Language
English
Rights
http://rightsstatements.org/vocab/InC/1.0/
License
http://creativecommons.org/licenses/by/4.0/
Date Available
5-4-2026
Recommended Citation
Lazenby, John, "Investigation of PRA for Rapid Part Replacement" (2024). Honors Theses.
https://scholar.utc.edu/honors-theses/475
Department
Dept. of Electrical Engineering