Committee Chair

Loveless, T. Daniel

Committee Member

Reising, Donald R.; Sreenivas, Kidambi

Department

Dept. of Electrical Engineering

College

College of Engineering and Computer Science

Publisher

University of Tennessee at Chattanooga

Place of Publication

Chattanooga (Tenn.)

Abstract

Photonic integrated circuits (PICs) are devices that transmit and perform operations on optical signals. PICs offer significant benefits compared to conventional electronics, including increased data transmission rates. Despite the desire to leverage these benefits for space systems increasing in recent years, the study of radiation effects in PICs is still limited, especially the transient radiation effects known as single-event effects (SEEs). A roadblock in advancing the understanding of SEEs in PICs is the inability to co-simulate radiation effects in both the optical and electrical domains. Establishing a means of simulating SEEs in PICs would aide in: (1) modeling SEEs in various devices, (2) determining specific mechanisms by which SEEs upset devices, and (3) discovering methods for improving the radiation hardness of PICs. This work introduces a methodology for the simulation of SEEs in PICs that couples optical and electrical domain simulations that are required to fully characterize SEEs in PICs.

Acknowledgments

This work was supported in part by the Tennessee Higher Education Commission (THEC) through the Center of Excellence in Applied Computational Science and Engineering (CEACSE) Program at the University of Tennessee at Chattanooga and the Defense Threat Reduction Agency (DTRA) under contract HDTRA1-17-1-0003.

Degree

M. S.; A thesis submitted to the faculty of the University of Tennessee at Chattanooga in partial fulfillment of the requirements of the degree of Master of Science.

Date

8-2019

Subject

Integrated optics; Integrated circuits; Photonics

Keyword

Single-event effects; Photonic integrated circuits; Simulation methodology; Waveguide; Single-event transient

Document Type

Masters theses

DCMI Type

Text

Extent

xvi, 78 leaves

Language

English

Rights

https://rightsstatements.org/page/InC/1.0/?language=en

License

http://creativecommons.org/licenses/by/4.0/

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