Committee Chair

Loveless, Thomas Daniel

Committee Member

Reising, Donald R.; Ahmed, Raga

Department

Dept. of Engineering

College

College of Engineering and Computer Science

Publisher

University of Tennessee at Chattanooga

Place of Publication

Chattanooga (Tenn.)

Abstract

System-level radiation effects analysis is performed using a time-dependent Probabilistic Risk Assessment (PRA) methodology. Data-driven models for the expected behavior of radiation-sensitive parts are instanced in a system model for Fault Tree Analysis (FTA). The system model is then solved using Bayesian Networks and Monte Carlo simulation in various mission environments, which may be dynamic and time-dependent. The results provide useful metrics of system reliability through hazardous radiation environments, identifying which failure modes and mission phases pose the greatest risk. A case study examining the NASA SpaceCube v2.0 processor demonstrates the PRA methodology with a comparison of risk in the International Space Station (ISS) and Geostationary Orbit (GEO) environments. The resulting analysis validates certain design choices and identifies the parts and subsystems which contribute most to system risk.

Degree

M. S.; A thesis submitted to the faculty of the University of Tennessee at Chattanooga in partial fulfillment of the requirements of the degree of Master of Science.

Date

5-2023

Subject

Radiation tolerance; Radiation--Risk assessment; Integrated circuits--Effect of radiation on

Keyword

engineering, radiation effects, reliability, fault tree analysis, probabilistic risk assessment

Document Type

Masters theses

DCMI Type

Text

Extent

ix, 46 leaves

Language

English

Rights

http://rightsstatements.org/vocab/InC/1.0/

License

http://creativecommons.org/licenses/by-nc-sa/3.0/

Date Available

1-31-2024

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